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2000, vol.100, no.140	2000, vol.100, no.313	2000, vol.100, no.377	2000, vol.100, no.445	2000, vol.100, no.524	2000, vol.100, no.623
2000, vol.100, no.66	2000, vol.100, no.706

题名	作者	出版年	年卷期
Positive bias temperature instability of p{sup}+ polysilicon gated pMOSFETs	Tadayuki Nakajima; Masahiro Fujimoto; Shinji Nakano; Ichiro Matsuo	2000	2000, vol.100, no.445
Ht carrier degradation of p{sup}+ polysilicon gated pMOSFETs	M. Fujimoto; T. Nakajima; S. Nakano	2000	2000, vol.100, no.445
Failure analysis system using extraction of killer function failure that has impact on yield	Fumihito Ohta; Yasukazu Mukogawa; Kouji Fukumoto; Youji Mashiko	2000	2000, vol.100, no.445
Securing the reliability in development of roof-integrated PV module: the fireproof performance and the waterproof performance	Komamine Tatsuya; Sugita Jun; Shono Hiroaki	2000	2000, vol.100, no.445
Availability of systems with self-diagnostic components	Tieling Zhang; Wei Long; Koichi Suyama; Yoshinobu Sato	2000	2000, vol.100, no.445