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期刊


ISSN1350-2409
刊名IEE proceedings
参考译名英国电气工程师学会论文集：电子线路与系统
收藏年代1998～2006

关联期刊参考译名收藏年代
IET Circuits, Devices & SystemsIET电子线路与系统2007～2012


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006

2002, vol.149, no.1 2002, vol.149, no.3 2002, vol.149, no.4 2002, vol.149, no.5-6

题名作者出版年年卷期
1/f noise in homogeneous and inhomogeneous mediaL. K. J. Vandamme; Gy. Trefan20022002, vol.149, no.1
Electrical noise as a reliability indicator in electronic devices and componentsB. K. Jones20022002, vol.149, no.1
Low-frequency noise in deep-submicron metal-oxide-semiconductor field-effect transistorsZ. Celik-Butler20022002, vol.149, no.1
Low frequency and 1/f noise in wide-gap semiconductors: silicon carbide and gallium nitrideM. E. Levinshtein; S. L. Rumyantsev; M. S. Shur; R. Gaska; M. A. Khan20022002, vol.149, no.1
Low-frequency noise in polysilicon-emitter bipolar transistorsM. J. Deen; E. Simoen20022002, vol.149, no.1
Has SiGe lowered the noise in transistors?J. A. Chroboczek; G. Ghibaudo20022002, vol.149, no.1
Low-frequency noise in III-V high-speed devicesA. Penarier; S. G. Jarrix; C. Delseny; F. Pascal; J. C. Vildeuil; M. Valenza; D. Rigaud20022002, vol.149, no.1
Noise in hydrogenated amorphous siliconR. E. Johanson; M. Gunes; S. O. Kasap20022002, vol.149, no.1
Low frequency noise in thin film transistorsD. Rigaud; M. Valenza; J. Rhayem20022002, vol.149, no.1



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