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ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2003, vol.34, no.1 2003, vol.34, no.2 2003, vol.34, no.3-5 2003, vol.34, no.6-7 2003, vol.34, no.8

题名作者出版年年卷期
Width determination of SiO{sub}2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer; Werner Grogger; Ferdinand Hofer20032003, vol.34, no.1
Direct observation of freeze-etching processes of ice-embedded biomembranes by atomic force microscopyDaisuke Yamamoto; Koji Tani; Toshiaki Gotoh; Tsutomu Kouyama20032003, vol.34, no.1
High resolution electron microscopy of precipitates in high Co-Ni alloy steelHu Zhengfei; Wu Xingfang20032003, vol.34, no.1
Terminal deletion mutants of myelin basic protein: new insights into self-association and phospholipid interactionsChristopher M. D. Hill; Jeffery D. Haines; Christine E. Antler; Ian R. Bates; David S. Libich; George Harauz20032003, vol.34, no.1
Vitellin cleavage products are proteolytically degraded by ubiquitination in stick insect embryosAntonella Cecchettini; Maria Teresa Locci; Massimo Masetti; Anna Maria Fausto; Gabriella Gambellini; Massimo Mazzini; Franco Giorgi20032003, vol.34, no.1
Electron-probe X-ray microanalysis of individual particles of solid snow sediment with size factor correctionO. Yu. Belozerova; A. L. Finkelshtein; L. A. Pavlova20032003, vol.34, no.1
Optical illusion in scanning electron micrographs: the case of the eggshell of Acrosternum (Chinavia) marginatum (Hemiptera: Pentatomidae)Klaus W. Wolf; Walton Reid; Michael Schrauf20032003, vol.34, no.1



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