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2006, vol.11, no.1	2006, vol.11, no.10	2006, vol.11, no.11	2006, vol.11, no.12	2006, vol.11, no.2	2006, vol.11, no.3
2006, vol.11, no.4	2006, vol.11, no.5	2006, vol.11, no.6	2006, vol.11, no.7	2006, vol.11, no.8	2006, vol.11, no.9

题名	作者	出版年	年卷期
Technology Trends - QUALITY CONTROL: System tests CMOS imagers and cameras	Andrew Wilson	2006	2006, vol.11, no.11
IMAGE PROCESSING - Third parties add value to FPOA designs	W. Conard Holton	2006	2006, vol.11, no.11
Machine vision speeds ammunition inspection	W. Conard Holton	2006	2006, vol.11, no.11
Robots and vision place engine-valve plates	W. Conard Holton	2006	2006, vol.11, no.11
LED lighting continues inroads in illumination - Advances in semiconductor and packaging techniques give LEDs advantages in many traditional and novel applications	J. Marcel LaFlamme	2006	2006, vol.11, no.11
Worldwide Industrial Camera Directory - Color-matching systems test visual quality	Jessica Gehlhar; Glenn Archer	2006	2006, vol.11, no.11
Reader software brings value to Data Matrix	Alain Nyeck	2006	2006, vol.11, no.11
Vision system measures scallops	Steve Tomanovich	2006	2006, vol.11, no.11
Laser scanners read dot-peened code - Laser line illumination is effective in difficult-to-scan 3-D Data Matrix code applications	Larry Smyth	2006	2006, vol.11, no.11
PCI Express captures frame-grabber designs - New generation of boards will guarantee the bandwith demanded by multiple-earner a configurations	Andrew Wilson	2006	2006, vol.11, no.11