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期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



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2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2009, vol.11, no.1 2009, vol.11, no.2 2009, vol.11, no.3 2009, vol.11, no.4

题名作者出版年年卷期
Pitfalls and Traps of Failure AnalysisDavid Burgess20092009, vol.11, no.1
Response to Counterfeit Integrated Circuit Components in the Supply Chain: Part IIGary E. Shade20092009, vol.11, no.1
Forward-Scattered Electron imaging Sample Holder Is AvailableLarry Wagner20092009, vol.11, no.1
FEI's New TryeCrystal Package Provides Rapid, Accurate Strain ProfilingLarry Wagner20092009, vol.11, no.1
Presto Engineering and SEMICAPS Announce Strategic OEM RelationshipLarry Wagner20092009, vol.11, no.1
FEI Introduces New X-FEG Electron SourceLarry Wagner20092009, vol.11, no.1
Presto's In-Silicon Analysis Services Now Available on the 300 mm Probe Station from MicromanipulatorLarry Wagner20092009, vol.11, no.1
Agilent Technologies Introduces Free Phase-Locked Loop Analysis SoftwareLarry Wagner20092009, vol.11, no.1
KLA-Tencor Introduces New. Monitor-Wafer Defect Inspection System for IC FobsLarry Wagner20092009, vol.11, no.1
Nondestructive Failure Localization - A Challenge for Sub-100 nm StructuresEhrenfried Zschech20092009, vol.11, no.1



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