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期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2013, vol.15, no.1 2013, vol.15, no.2 2013, vol.15, no.3 2013, vol.15, no.4

题名作者出版年年卷期
An Overview of LED TechnologyMartine Simard-Normandin20132013, vol.15, no.4
Accelerated Reliability Testing for Power Semiconductor PackagesMichael Goroll; Reinhard Pufall20132013, vol.15, no.4
Automated Workflow Improves Speed and Precision of S/TEM Process Monitoring for 22 nm FinFET StructuresLarry Dworkin20132013, vol.15, no.4
Analysis of Electronic Devices with a Three-Dimensional Atom ProbeSergej Mutas20132013, vol.15, no.4
The IARPA Circuit Analysis Tools ProgramCarl E. McCants20132013, vol.15, no.4



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