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期刊


ISSN0960-1317
刊名Journal of Micromechanics and Microengineering
参考译名微型机械与微型工程学报
收藏年代2006~2025



全部

2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2018, vol.28, no.1 2018, vol.28, no.10 2018, vol.28, no.11 2018, vol.28, no.12 2018, vol.28, no.2 2018, vol.28, no.3
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题名作者出版年年卷期
Nanomechanical characterization of SU8/ZnO nanocomposite films for applications in energy-harvesting microsystemsKrishna, B.; Chaturvedi, A.; Mishra, N.; Das, K.20182018, vol.28, no.11
Polymer elastic bump formation through photodefinable thermal reflow process for system in foil packageLee, Chung Woo; Lee, Jae Hak; Song, Jun Yeob; Kim, Seung Man; Kim, Yong Jin; Kim, Chan20182018, vol.28, no.11
A new low-cost fabrication method of SU-8 micro-nano channels and needle tip in electro-hydrodynamic jet chipsSun, Lei; Liu, Lingpeng; Qi, Liping; Zhou, Jiangang; Yin, Zhifu; Wu, Dongjiang; Zou, Helin20182018, vol.28, no.11
Mass copper micro-embossing by tungsten die for MEMS applicationsLi, Xuanyang; Liu, Jian; Xu, Jie; Wang, Zetian; Chen, Jing20182018, vol.28, no.11
A wide-bandwidth tri-axial pendulum accelerometer with fully-differential nano-gap electrodesJeong, Y.; Serrano, D. E.; Ayazi, F.20182018, vol.28, no.11
Fabrication and characterization of double curvature bendable silicon wafersLips, Bram; Puers, Robert20182018, vol.28, no.11
Simple effective shear modulus approximation for single crysta Si torsional barsMaimon, R.; Krakover, N.; Tepper-Faran, T.; Gerson, Y.; Krylov, S.20182018, vol.28, no.11
Method for controlling stress gradients in PVD aluminum nitrideKnisely, Katherine E.; Hunt, Bram; Troelsen, Brian; Douglas, Erica; Griffin, Benjamin A.; Stevens, James E.20182018, vol.28, no.11
Tunable optical absorption of dimer nanostructure array achieved by angular evaporationKong, Zhe; Zhang, Gufei; Zhang, Jian; Zhang, Xuefeng; Yao, Xiaoli; Shi, Zhen; Li, Chunhui20182018, vol.28, no.11
Realization and AC modeling of electronic circuits with water-gated field effect transistors (WG-FETs) based on gate probe distanceSonmez, Bedri Gurkan; Ertop, Ozan; Mutlu, Senol20182018, vol.28, no.11
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