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期刊


ISSN1524-1904
刊名Applied Stochastic Models in Business and Industry
参考译名商业与工业应用随机模型
收藏年代2002～2023

关联期刊参考译名收藏年代
Applied Stochastic Models in Business and Industry商业与工业应用随机模型2024～2026


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2002 2003 2004 2005 2006 2007
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2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Special issue of ASMBI dedicated to the 10th International Conference on Mathematical Methods in Reliability (MMR 2017) FOREWORDGaudoin, Olivier; Lindqvist, Bo H.20192019, vol.35, no.2
Reliability, signature, and relative quality functions of systems under time-homogeneous load-sharing modelsSpizzichino, Fabio L.20192019, vol.35, no.2
Findings about the BMMPP for modeling dependent and simultaneous data in reliability and queueing systemsYera, Yoel G.; Lillo, Rosa E.; Ramirez-Cobo, Pepa20192019, vol.35, no.2
On the reliability function of a double redundant system with general repair time distributionRykov, Vladimir; Kozyrev, Dmitry20192019, vol.35, no.2
A perturbed gamma degradation process with degradation dependent non-Gaussian measurement errorsGiorgio, Massimiliano; Mele, Agostino; Pulcini, Gianpaolo20192019, vol.35, no.2
Imperfect repair in degradation processes: A Kijima-type approachKahle, Waltraud20192019, vol.35, no.2
A parametric lifetime model for a multicomponents system with spatial interactionsCorset, F.; Fouladirad, M.; Paroissin, C.; Remy, E.20192019, vol.35, no.2
Bayesian analysis for step-stress accelerated life testing under progressive interval censoringKohl, Christian; Kateri, Maria20192019, vol.35, no.2
Tests for specific nonparametric relations between two distribution functions with applicationsDeshpande, J. V.; Dewan, Isha; Lam, K. F.; Naik-Nimbalkar, U. V.20192019, vol.35, no.2
Is reliability a new science? A paper from the panel session held at the 10th International Conference on Mathematical Methods in ReliabilitySingpurwalla, Nozer D.; Volovoi, Vitali; Brown, Mark; Pekoz, Erol A.; Ross, Sheldon M.; Meeker, William Q.20192019, vol.35, no.2
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