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期刊


ISSN0960-1317
刊名Journal of Micromechanics and Microengineering
参考译名微型机械与微型工程学报
收藏年代2006～2025



全部

2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2022, vol.32, no.1 2022, vol.32, no.10 2022, vol.32, no.11 2022, vol.32, no.12 2022, vol.32, no.2 2022, vol.32, no.3
2022, vol.32, no.4 2022, vol.32, no.5 2022, vol.32, no.6 2022, vol.32, no.7 2022, vol.32, no.8 2022, vol.32, no.9

题名作者出版年年卷期
Influence of source electrode metal work function on polar gate prompted source hole plasma in arsenide/antimonide tunneling interfaced junctionless TFETSharma, Samriti; Chaujar, Rishu20222022, vol.32, no.4
An electrochemical biosensor with integrated microheater to improve the sensitivity of electrochemical nucleic acid biosensorsAkcakoca, Iremnur; Ghorbanpoor, Hamed; Blair, Ewen; Ozturk, Yasin; Dizaji, Araz Norouz; Kocagoz, Tanil; Corrigan, Damion; Guzel, Fatma Dogan; Avci, Huseyin20222022, vol.32, no.4
Improvement on the uniformity of deep reactive ion etch for electrically isolated silicon-based substratesHu, Xiao; Zhen, Zhihan; Sun, Guotao; Wang, Qingkang; Huang, Qiyu20222022, vol.32, no.4
Solving curing-protocol-dependent shape errors in PDMS replicationDelplanque, Emilie; Aymard, Antoine; Dalmas, Davy; Scheibert, Julien20222022, vol.32, no.4
Bipolar resistive switching properties of TiO (x) /graphene oxide doped PVP based bilayer ReRAMSaini, Shalu; Dwivedi, Anurag; Khandelwal, Arpit; Tiwari, Shree Prakash; Lodhi, Anil20222022, vol.32, no.4
A position sensing method for 2D scanning mirrorsGhazinouri, Behrad; He, Siyuan; Tai, Trevor S.20222022, vol.32, no.4
Scotch-tape surface wrinkling based thin-film material properties extractionSeok, Seonho; Park, HyungDal; Kim, Jinseok20222022, vol.32, no.4
A triboelectric nanosensor based on ultra-thin MXene composite paper for heavy metal ion detectionGai, Yansong; Shan, Yizhu; Li, Qi; Jiang, Tao; Feng, Hongqing; Li, Zhou; Bai, Yuan; Wang, Engui; Cao, Yu20222022, vol.32, no.4
Multiaxial resonant MEMS force sensor (vol 28, 105002, 2018)Dabsch, Alexander; Rosenberg, Christoph; Klug, Patrick; Trimmel, Majesa; Keplinger, Franz20222022, vol.32, no.4
Role of gate electrode in influencing interface trap sensitivity in SOI tunnel FETsDeb, Deepjyoti; Baruah, Ratul Kr; Saha, Rajesh; Kandpal, Kavindra; Goswami, Rupam20222022, vol.32, no.4
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