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期刊


刊名SIAM Journal on Imaging Sciences
参考译名工业与应用数学学会成像科学杂志
收藏年代2020～2025



全部

2020 2021 2022 2023 2024 2025

2023, vol.16, no.1 2023, vol.16, no.2 2023, vol.16, no.3 2023, vol.16, no.4

题名作者出版年年卷期
Short Communication: Localized Adversarial Artifacts for Compressed Sensing MRIRima Alaifari; Giovanni S. Alberti; Tandri Gauksson20232023, vol.16, no.4
Self-Supervised Deep Learning for Image Reconstruction: A Langevin Monte Carlo ApproachJi Li; Weixi Wang; Hui Ji20232023, vol.16, no.4
Learning Regularization Parameter-Maps for Variational Image Reconstruction Using Deep Neural Networks and Algorithm UnrollingAndreas Kofler; Fabian Altekruger; Fatima Antarou Ba; Christoph Kolbitsch; Evangelos Papoutsellis; David Schote; Clemens Sirotenko; Felix Frederik Zimmermann; Kostas Papafitsoros20232023, vol.16, no.4
IFF: A Superresolution Algorithm for Multiple MeasurementsZetao Fei; Hai Zhang20232023, vol.16, no.4
Transionospheric Autofocus for Synthetic Aperture RadarMikhail Gilman; Semyon V. Tsynkov20232023, vol.16, no.4
An Operator Theory for Analyzing the Resolution of Multi-illumination Imaging ModalitiesPing Liu; Habib Ammari20232023, vol.16, no.4
Spherical Framelets from Spherical DesignsYuchen Xiao; Xiaosheng Zhuang20232023, vol.16, no.4
The Split Gibbs Sampler Revisited: Improvements to Its Algorithmic Structure and Augmented Target DistributionMarcelo Pereyra; Luis A. Vargas-Mieles; Konstantinos C. Zygalakis20232023, vol.16, no.4
Sequential Model Correction for Nonlinear Inverse ProblemsArttu Arjas; Mikko J. Sillanpaa; Andreas S. Hauptmann20232023, vol.16, no.4
A Common Lines Approach for Ab Initio Modeling of Molecules with Tetrahedral and Octahedral SymmetryAdi Shasha Geva; Yoel Shkolnisky20232023, vol.16, no.4
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