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期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2025, vol.27, no.1

题名作者出版年年卷期
ELECTRONICS INDUSTRY GETS GOVERNMENT ATTENTIONE. Jan Vardaman20252025, vol.27, no.1
FULL CHIP BACKSIDE DELAYERING OF 10 nm NODE INTEGRATED CIRCUITS WITH CHEMICALLY ASSISTED FOCUSED ION BEAM DEPROCESSINGMichael DiBattista; Robert Chivas; Ata Tafazoli Yazdi; Jonathan Sheeder; Scott Silverman20252025, vol.27, no.1
LOW FREQUENCY NOISE SPECTROSCOPY: A POWERFUL DIAGNOSTIC TOOL FOR TRAP IDENTIFICATION IN ACTIVE AND PASSIVE COMPONENTSB. Cretu; A. Tahiat; R. Coq Germanicus; F. Bezerra; C. Bunel; A. Veloso; E. Simoen20252025, vol.27, no.1
QUANTUM DIAMOND MICROSCOPY FOR SEMICONDUCTOR FAILURE ANALYSISMarwa Garsi; Andreas Welscher; Manuel Schrimpf; Bartu Bisgin; Michael Hanke; Horst Gieser; Daniela Zahn; Fleming Bruckmaier20252025, vol.27, no.1
ISTFA 2024 HIGHLIGHTSYan Li20252025, vol.27, no.1
WEFA 2024 ISTFA LUNCH SESSION RECAPAmrutha Sampath; Renee Parente; Sarah Poehlmann20252025, vol.27, no.1
A SUMMARY OF THE ISTFA 2024 PANEL DISCUSSION: AI APPLICATIONS IN FAILURE ANALYSISTed Kolasa; Greg Johnson20252025, vol.27, no.1
ISTFA 2024 USER GROUP HIGHLIGHTSDaminda Dahanayaka; Joy Liao; Anita Madan20252025, vol.27, no.1
ISTFA 2024 ARTIFICIAL INTELLIGENCE (AI) IN FAILURE ANALYSIS USER GROUPPeter Hoffrogge; Thomas Rodgers; Konstantin Schekotihin; Sebastian Brand; Florian Felux20252025, vol.27, no.1
ISTFA 2024 FOCUSED ION BEAM (FIB) USER GROUPValerie Brogden; Steve Herschbein; Michael Wong; Edward Principe20252025, vol.27, no.1
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