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期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2025, vol.27, no.1 2025, vol.27, no.2 2025, vol.27, no.3

题名作者出版年年卷期
THE CHIPS ACT AND ITS IMPACT ON THE SEMI-CONDUCTOR INDUSTRY AND ANALYTICAL LABSSteve Herschbein20252025, vol.27, no.2
SILICON PHOTONIC FAILURE ANALYSIS USING NEAR INFRARED MICROSCOPYArpan Dasgupta20252025, vol.27, no.2
CALL FOR EDFAS STUDENT BOARD MEMBERanonymous20252025, vol.27, no.2
A NOVEL ION MICROSCOPE FOR HIGH-RESOLUTION ION IMAGING AND SIMS NANOANALYTICS WITH PRECISE SAMPLE NAVIGATIONPeter Gnauck; Alexander Ost; Torsten Richter20252025, vol.27, no.2
FIB SEM MEETING 2025anonymous20252025, vol.27, no.2
IPFA 2025anonymous20252025, vol.27, no.2
STUDY ABOUT THE CORROSION OF SAC SOLDER JOINTS UNDER VARIOUS CONDITIONS OF TEMPERATURE AND SALINITYA. Guedon-Gracia; K. E. Akoda; J. -Y. Deletage; H. Fremont20252025, vol.27, no.2
7th IEEE INTERNATIONAL CONFERENCE ON PHYSICAL ASSURANCE AND INSPECTION OF ELECTRONICS (PAINE)Michael DiBattista20252025, vol.27, no.2
MICROSCOPY & MICROANALYSIS MEETING 2025anonymous20252025, vol.27, no.2
ESREF 2025anonymous20252025, vol.27, no.2
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