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OA期刊


ISSN0353-3670
刊名Facta Universitatis. Series Electronics and Energetics
出版商Univerzitet u Nishu / University of Nis
urlhttp://factaee.elfak.ni.ac.rs/
机构Univerzitet u Nishu / University of Nis;Univerzitet u Nishu / University of Nis



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2015, vol.28, no.2 2015, vol.28, no.3 2015, vol.28, no.4 2015, vol.29, no.1

题名作者出版年年卷期
INFRARED THERMOGRAPHY APPLIED TO POWER ELECTRON DEVICES INVESTIGATIONGiovanni BreglioUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies,Andrea IraceUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies,Luca MarescaUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies,Michele RiccioUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies,Gianpaolo RomanoUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies,Paolo SpiritoUniversity of Naples "Federico II" Department of Electrical Engineering and Information technologies20152015, vol.28, no.2
NOVEL, LOW POWER, NONLINEAR DILATATION AND EROSION FILTERS REALIZED IN THE CMOS TECHNOLOGYRafal Dlugosz,Andrzej Rydlewski,Tomasz Talaśka20152015, vol.28, no.2
DESIGN OF CMOS READOUT FRONTEND CIRCUIT FOR MEMS CAPACITIVE MICROPHONESDaniel ArbetDepartment of IC Design and TestSlovak University of TechnologyIlkovicova 3, 812 19 Bratislava,Viera StopjakováDepartment of IC Design and TestSlovak University of TechnologyIlkovicova 3, 812 19 Bratislava,Martin KováčDepartment of IC Design and TestSlovak University of TechnologyIlkovicova 3, 812 19 Bratislava,Lukáš NagyDepartment of IC Design and TestSlovak University of TechnologyIlkovicova 3, 812 19 Bratislava,Gabriel NagyDepartment of IC Design and TestSlovak University of TechnologyIlkovicova 3, 812 19 Bratislava20152015, vol.28, no.2
SYSTEM DESIGN CONSIDERATIONS OF UNIVERSAL UHF RFID READER TRANSCEIVER ICSNikolay UsachevNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,Vadim ElesinNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,Alexander NikiforovNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,George ChukovNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,Galina NazarovaNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,Denis SotskovNational Research Nuclear University MEPhI (NRNU MEPhI), Moscow, Russian Federation,Nikolay ShelepinMikron, JSCMoscow, Russian Federation,Vladislav DmitrievMikron, JSCMoscow, Russian Federation20152015, vol.28, no.2
IMAGE AND VIDEO PROCESSING WITH FPGA SUPPORT USED FOR BIOMETRIC AS WELL AS OTHER APPLICATIONSAndrzej NapieralskiLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Jakub CłapaLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Kamil GrabowskiLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Małgorzata NapieralskaLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Wojciech SankowskiLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Przemysław SękalskiLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz,Mariusz ZubertLodz University of Technology, Department of Microelectronics and Computer Science, ul. Wolczanska 221/223, 90-924 Lodz20152015, vol.28, no.2
THE CURRENT STATUS OF POWER SEMICONDUCTORSJan VobeckyABB Switzerland Ltd. Semiconductors, Lenzburg20152015, vol.28, no.2
NEW GENERATION OF 3.3 KV IGBTS WITH MONOLITICALLY INTEGRATED VOLTAGE AND CURRENT SENSORSDavid FloresInstituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), Campus UAB, 08193, Cerdanyola del Vallès, Barcelona, Spain,Salvador HidalgoInstituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), Campus UAB, 08193, Cerdanyola del Vallès, Barcelona, Spain,Jesús UrrestiSchool of Electrical and Electronic Engineering, Newcastle University, Merz Court, Newcastle Upon Tyne, NE1 7RU, UK20152015, vol.28, no.2
OSCILLATION-BASED TESTING METHOD FOR DETECTING SWITCH FAULTS IN HIGH-Q SC BIQUAD FILTERSMiljana MilicFaculty of Electronic Engineering, Universigy of Nis,Vančo LitovskiFaculty of Electronic Engineering, Universigy of Nis20152015, vol.28, no.2
NUMERICAL ANALYSIS OF ZNO THIN LAYERS HAVING ROUGH SURFACESantolo DalientoUniversity of Naples "Federico II",Pierluigi GuerrieroUniversity of Naples "Federico II",Maria Luisa AddonizioENEA Research center, Località Granatello, Portici,Alessandro AntonaiaENEA Research center, Località Granatello, Portici20152015, vol.28, no.2
STUDY ON THE SPATIAL GENERATION OF BREAKDOWN SPOTS IN MIM CAPACITORS WITH DIFFERENT ASPECT RATIOSXavier SauraDepartment d'Enginyeria Electronica, University of Barcelona,Michele RiccioDepartment of Electrical Engineering and Information Technologies, University of Naples Federico II, Via Claudio 21, 80125 Naples, Italy,Giuseppe De FalcoDepartment of Electrical Engineering and Information Technologies, University of Naples Federico II, Via Claudio 21, 80125 Naples, Italy,Jordi SuñéDepartment d'Enginyeria Electronica, University of Barcelona,Andrea IraceDepartment of Electrical Engineering and Information Technologies, University of Naples Federico II, Via Claudio 21, 80125 Naples, Italy,Enrique MirandaDepartment d'Enginyeria Electronica, University of Barcelona20152015, vol.28, no.2
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