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OA期刊


ISSN0013-5194
刊名Electronics letters
出版商Institution of Electrical Engineers
urlhppt://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2220
机构Wiley



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2016, vol.52, no.1 2016, vol.52, no.10 2016, vol.52, no.11 2016, vol.52, no.12 2016, vol.52, no.13 2016, vol.52, no.14
2016, vol.52, no.15 2016, vol.52, no.16 2016, vol.52, no.17 2016, vol.52, no.18 2016, vol.52, no.19 2016, vol.52, no.2
2016, vol.52, no.20 2016, vol.52, no.21 2016, vol.52, no.22 2016, vol.52, no.23 2016, vol.52, no.24 2016, vol.52, no.25
2016, vol.52, no.3 2016, vol.52, no.4 2016, vol.52, no.5 2016, vol.52, no.6 2016, vol.52, no.7 2016, vol.52, no.8
2016, vol.52, no.9

题名作者出版年年卷期
(n, n(n − 1), n − 1) Permutation codes based on packing and Mendelsohn designsLi Peng;20162016, vol.52, no.23
Person re-identification with discriminatively trained viewpoint invariant orthogonal dictionariesBin Gao;Mingyong Zeng;Shiming Xu;Fenggang Sun;Jibin Guo;20162016, vol.52, no.23
Local accumulated smoothing patterns for fingerprint liveness detectionW. Kim;C. Jung;20162016, vol.52, no.23
Ultra-low power pass-transistor-logic-based delay line design for sub-threshold applicationsR.N. Tadros;N. Dasari;P.A. Beerel;20162016, vol.52, no.23
Feedback delay reduction of Tomlinson–Harashima precoder in 14 nm CMOS via pipelined MAC units operated entirely with CSA arithmeticM. Kossel;M. Brändli;P. Francese;L. Kull;C. Menolfi;T. Morf;T. Toifl;A. Cevrero;D. Luu;I. Özkaya;H. Yüksel;20162016, vol.52, no.23
Voltage-in-current formulation for the latency insertion method for improved stabilityK.H. Tan;P. Goh;M.F. Ain;20162016, vol.52, no.23
Wafer-level vacuum encapsulated breath-mode ring resonator fabricated in a commercial MEMS processG. Xereas;V.P. Chodavarapu;20162016, vol.52, no.23
Driver circuit for a PAM-4 optical transmitter using 65 nm CMOS and silicon photonic technologiesS. Zhou;H. Wu;K. Sadeghipour;C. Scarcella;C. Eason;M. Rensing;M. Power;C. Antony;P. O'Brien;P. Townsend;P. Ossieur;20162016, vol.52, no.23
80 GBd 6-bit DAC in InP DHBT for arbitrary waveform generatorY. Arayashiki;M. Ikeda;Y. Amano;20162016, vol.52, no.23
Underestimation of measured self-heating in nanowires by using gate resistance techniqueG. Mariniello;M. Cassé;G. Reimbold;M.A. Pavanello;20162016, vol.52, no.23
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