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OA期刊


ISSN1751-8601
刊名IET computers & digital techniques
出版商IET
urlhttp://ieeexplore.ieee.org/servlet/opac?punumber=4117424
机构Wiley



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2019, vol.13, no.1 2019, vol.13, no.2 2019, vol.13, no.3 2019, vol.13, no.4 2019, vol.13, no.5 2019, vol.13, no.6

题名作者出版年年卷期
Design of an extended 2D mesh network-on-chip and development of A fault-tolerantrouting methodYota Kurokawa;Masaru Fukushi;20192019, vol.13, no.3
Study of the monte–carlo fault injection simulator to measure a fault deratingDong-Woo Lee;Jong-Whoa Na;20192019, vol.13, no.3
RASSS: a hijack-resistant confidential information management scheme for distributed systemsLake Bu;Mihailo Isakov;Michel A. Kinsy;20192019, vol.13, no.3
HASTI: hardware-assisted functional testing of embedded processors in idle timesArezoo Kamran;20192019, vol.13, no.3
Kernel and layer vulnerability factor to evaluate object detection reliability in GPUsFernando Fernandes dos Santos;Luigi Carro;Paolo Rech;20192019, vol.13, no.3
Fluid-level synthesis unifying reliability, contamination avoidance, and capacity-wastage-aware washing for droplet-based microfluidic biochipsArpan Chakraborty;Piyali Datta;Rajat Kumar Pal;20192019, vol.13, no.3
Scheduling configuration memory error checks to improve the reliability of FPGA-based systemsNguyen Tran Huu Nguyen;Ediz Cetin;Oliver Diessel;20192019, vol.13, no.3
Removing constant-induced errors in stochastic circuitsPaishun Ting;John P. Hayes;20192019, vol.13, no.3
SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuitAmbika Prasad Shah;Nandakishor Yadav;Ankur Beohar;Santosh K. Vishvakarma;20192019, vol.13, no.3
Soft-error reliable architecture for future microprocessorsShoba Gopalakrishnan;Virendra Singh;20192019, vol.13, no.3
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