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OA期刊
ISSN
0013-5194
刊名
Electronics letters
出版商
Institution of Electrical Engineers
url
hppt://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2220
机构
Wiley
全部
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2024
2020, vol.56, no.1
2020, vol.56, no.10
2020, vol.56, no.11
2020, vol.56, no.12
2020, vol.56, no.13
2020, vol.56, no.14
2020, vol.56, no.15
2020, vol.56, no.16
2020, vol.56, no.17
2020, vol.56, no.18
2020, vol.56, no.19
2020, vol.56, no.2
2020, vol.56, no.20
2020, vol.56, no.21
2020, vol.56, no.22
2020, vol.56, no.23
2020, vol.56, no.24
2020, vol.56, no.25
2020, vol.56, no.3
2020, vol.56, no.4
2020, vol.56, no.5
2020, vol.56, no.6
2020, vol.56, no.7
2020, vol.56, no.8
2020, vol.56, no.9
题名
作者
出版年
年卷期
Weakly supervised retinal vessel segmentation algorithm without groundtruth
Zheng Lu;Dali Chen;Dingyu Xue;
2020
2020, vol.56, no.23
Step-controllable RF MEMS tunable capacitor with ultra-wide tuning range using netted metal membrane
H. Cho;J. Kim;J.Y. Park;
2020
2020, vol.56, no.23
Improved multiscale local phase quantisation histogram for the recognition of blurred dorsal hand vein images
Fu Liu;Shoukun Jiang;Bing Kang;Tao Hou;
2020
2020, vol.56, no.23
Spike-driven gated recurrent neural network processor for electrocardiogram arrhythmias detection realised in 55-nm CMOS technology
Yuancong Wu;Y.H. Liu;Shuang Liu;Q. Yu;T.P. Chen;Y. Liu;
2020
2020, vol.56, no.23
Compact wideband SIW cavity-backed slot antenna using triple resonance and hybrid mode
Le Kang;Mei Wang;Ping Zhang;Jin Zhu Zhou;
2020
2020, vol.56, no.23
Low-profile dual-polarised metasurface-enabled antenna array for base-station applications
Shuang Ji;Changrong Liu;Xueguan Liu;Xinmi Yang;
2020
2020, vol.56, no.23
Delay analysis in the discrete-time multi-server queue with batch arrivals of packets having deterministic length
S. Lee;B. Kim;J. Kang;
2020
2020, vol.56, no.23
Weakly supervised classification model for zero-shot semantic segmentation
Fengli Shen;Zong-Hui Wang;Zhe-Ming Lu;
2020
2020, vol.56, no.23
0.67-μm2 /bitcell two-transistor leakage-based physically unclonable function with native bit-instability of 0.89% at 65 nm
Gang Li;Pengjun Wang;Xuejiao Ma;Bo Chen;
2020
2020, vol.56, no.23
Pipelined extended-counting for 3D-stacked CMOS image sensors
N. Callens;J. Lefebvre;G. Gielen;
2020
2020, vol.56, no.23
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