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OA期刊


ISSN0013-5194
刊名Electronics letters
出版商Institution of Electrical Engineers
urlhppt://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2220
机构Wiley



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2022, vol.58, no.1 2022, vol.58, no.10 2022, vol.58, no.11 2022, vol.58, no.12 2022, vol.58, no.13 2022, vol.58, no.14
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题名作者出版年年卷期
Bayesian adaptive direction detector in sample‐starved environmentMinghui Sha;Erke Mao;Fei Meng;20222022, vol.58, no.12
Building 3D reconstruction of TomoSAR using multiple bounce scattering modelFubo Zhang;Yaqian Yang;Longyong Chen;Ling Yang;20222022, vol.58, no.12
A switched‐capacitor‐assisted wireless power transfer system with regulating TX power and fast global loopChenyu Huang;Yan Lu;Chenchang Zhan;Rui P. Martins;20222022, vol.58, no.12
An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memoriesHM. Cao;F. Liu;Q. Wang;ZC. Du;L. Jin;ZL. Huo;20222022, vol.58, no.12
Multi‐label hybrid radar signals recognition and visualization based on interpretable convolutional classification layer and discriminative region suppressionWeijian Si;Jiaji Luo;Zhian Deng;20222022, vol.58, no.12
Unidirectional medium voltage rectifier utilizing sinusoidal input currentsMarkus Makoschitz;20222022, vol.58, no.12
Local earthquake magnitude estimation using ridge regression modelHyeongki Ahn;Kyunghyun Lee;Hyunchang Kim;Mingyuan Hu;Kwanho You;20222022, vol.58, no.12
Dickson basis multiplier with concurrent error detection against fault attacks for lightweight cryptosystemsChe Wun Chiou;Yuh‐Sien Sun;Che Wei Liang;Liang Yu Chen;Shih En Dai;Chen En To;Chen Che Chien;20222022, vol.58, no.12
Low‐leakage track‐and‐hold buffer in 130‐nm CMOS with open‐gate FET biasSusan L. Morton;Chan‐tang Tsen;Anthony F. Ortiz;Albert E. Cosand;20222022, vol.58, no.12
Colours of velvet noiseNils Meyer‐Kahlen;Sebastian J. Schlecht;Vesa Välimäki;20222022, vol.58, no.12
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