8th International Conference on Advanced Micro-Device Engineering (AMDE 2016) | www.gmachineinfo.com

会议文集

文集名	Means and Methods for Measurement and Monitoring
会议名	8th International Conference on Advanced Micro-Device Engineering (AMDE 2016)
中译名	《第八届高级微器件工程国际会议》
会议日期	9 December 2016
会议地点	Kiryu, Japan
出版年	2019
馆藏号	hyw07394

题名	作者	出版年
Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion	JianLong Wang; Gopal Adhikari; Haruo Kobayashi; Nobukazu Tsukiji; Mayu Hirano; Keita Kurihara; Akihito Nagahama; Ippei Noda; Kohji Yoshii	2019
Effect of Phase Error in Phase-Shifting Interferometer	Yoshitaka Takahashi	2019
Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization	Nobukazu Takaia; Kento Suzuki; Yoshiki Sugawara	2019
RC Polyphase Filter as Complex Analog Hilbert Filter	Yoshiro Tamura; Ryo Sekiyama; Shu Sasaki; Koji Asami; Haruo Kobayashi	2019
Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback	Yasushi Yuminaka; Motoaki Fujii; Atsushi Manabe; Makoto Hasegawa; Naoki Wada	2019
Determination of Phase Shift by Digital Holography	Yoshitaka Takahashi; Masatoshi Saito; Toru Nakajima; Masakazu Shingu	2019
Noise Filter for Surface Shape Measurement in Digital Holography	Yoshitaka Takahashi; Masakazu Shingu; Masatoshi Saito; Toru Nakajima; Ryutaro Sekiguchi; Masataka Chiba	2019
High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform Generator	Shohei Shibuya; Tomonori Yanagida; Koji Asami; Haruo Kobayashi	2019
Multi-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding	Yosuke Iijima; Yasushi Yuminaka	2019
A Torque-Sensorless Viscometer for Food Processing Applications	Y. Jiang; S. Hashimoto; Y. Yamakoshi; Takashi Otomo	2019
Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method	Akihiro Takita; Taku Iwashita; Yusaku Fujii	2019
Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2~n - 1	Yuuki Tanaka	2019
Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source	Akie Nagao; Toshinori Yamazaki; Masami Torikoshi; Naoki Sunaguchi; Tatsuaki Kanai; Tamako Hayashi; Kosuke Suzuki; Kazushi Hoshi; Hiroshi Sakurai	2019
A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOS	Nobuakazu Tsukiji; Hitoshi Aoki; Haruo Kobayashi	2019