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期刊


ISSN0268-3768
刊名The International Journal of Advanced Manufacturing Technology
参考译名先进制造技术国际杂志
收藏年代1998～2023



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023

2002, vol.19, no.1 2002, vol.19, no.10 2002, vol.19, no.11 2002, vol.19, no.12 2002, vol.19, no.2 2002, vol.19, no.3
2002, vol.19, no.4 2002, vol.19, no.5 2002, vol.19, no.6 2002, vol.19, no.7 2002, vol.19, no.8 2002, vol.19, no.9
2002, vol.20, no.1 2002, vol.20, no.10 2002, vol.20, no.11 2002, vol.20, no.12 2002, vol.20, no.2 2002, vol.20, no.3
2002, vol.20, no.4 2002, vol.20, no.5 2002, vol.20, no.6 2002, vol.20, no.7 2002, vol.20, no.8 2002, vol.20, no.9

题名作者出版年年卷期
Feature recognition patterns for form features using boundary representation modelsN. Ismail; N. Abu Bakar; A. H. Juri20022002, vol.20, no.8
A web-based remote cooperative design for spatial cam mechanismsG. F. Yin; G. Y. Tian; D. Taylor20022002, vol.20, no.8
A structure-oriented product data representation of engineering changes for supporting integrity constraintsN. Do; I. J. Choi; M. K. Jang20022002, vol.20, no.8
Segmentation of the measured point data in reverse engineeringH. -C. Kim; S. -M. Hur; S. -H. Lee20022002, vol.20, no.8
Development of an adaptive directional reduced integration technique and its application to rigid-plastic finite-element analysis of heading and backward extrusionN. R. Chitkara; Y. J. Kim20022002, vol.20, no.8
Simulation of upset heading, application of rigid-plastic finite element analysis and some experimentsN. R. Chitkara; Y. Kim20022002, vol.20, no.8
Determining the optimum process mean under quality loss functionC. -H. Chen; C. -Y. Chou; K. -W. Huang20022002, vol.20, no.8
Repeatability/linearity study and measurement loss cost analysis of an automatic gaugeY. -R. Shiau20022002, vol.20, no.8
Prediction of gasket leakage rate and sealing performance through fuzzy logicJ. Arghavani; M. Derenne; L. Marchand20022002, vol.20, no.8
A novel representation scheme for disassembly sequence planningJ. R. Li; L. P. Khoo; S. B. Tor20022002, vol.20, no.8



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