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期刊


ISSN1350-2387
刊名IEE Proceedings
参考译名英国电气工程师学会论文集：计算机与数字技术
收藏年代1999～2006

关联期刊参考译名收藏年代
IET Computers & Digital TechniquesIET计算机与数字技术2007～2012


全部

1999 2000 2001 2002 2003 2004
2005 2006

2005, vol.152, no.1 2005, vol.152, no.2 2005, vol.152, no.3 2005, vol.152, no.4 2005, vol.152, no.5 2005, vol.152, no.6

题名作者出版年年卷期
System level processor/communication co-exploration methodology for multiprocessor system-on-chip platformsA. Wieferink; M. Doerper; R. Leupers; G. Ascheid; H. Meyr; T. Kogel; G. Braun; A. Nohl20052005, vol.152, no.1
Architecture-level performance estimation method based on system-level profilingK. Ueda; K. Sakanushi; Y. Takeuchi; M. Imai20052005, vol.152, no.1
Synchronous protocol automate: a framework for modelling and verification of SoC communication architecturesV. D'silva; S. Ramesh; A. Sowmya20052005, vol.152, no.1
Overhead-conscious voltage selection for dynamic and leakage energy reduction of time-constrained systemsA. Andrei; M. Schmitz; P. Eles; Z. Peng; B. M. Al-Hashimi20052005, vol.152, no.1
Hierarchical multi-dimensional table lookup for model-compiler-based circuit simulationB. Wan; C.-J. R. Shi20052005, vol.152, no.1
Phase-frequency transfer model of analogue and mixed-signal front-end architectures for system-level designE. S. J. Martens; G. G. E. Gielen20052005, vol.152, no.1
Noisy signal based background technique for gain error correction in pipeline ADCsA. J. Gines; E. J. Peralfas; A. Rueda20052005, vol.152, no.1
Resource-constrained system-on-a-chip test: a surveyQ. Xu; N. Nicolici20052005, vol.152, no.1
Unified SOC test approach based on test date compression and TAM designV. Iyengar; A. Chandra20052005, vol.152, no.1
Compression considerations in test access mechanism designP. T. Gonciari; P. Rosinger; B. M. Al-Hashimi20052005, vol.152, no.1
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