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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：电子装置
收藏年代2000～2022

关联期刊参考译名收藏年代
電子情報通信学会技術研究報告电子信息通信学会技术研究报告：电子装置 


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2003, vol.103, no.117 2003, vol.103, no.159 2003, vol.103, no.160 2003, vol.103, no.161 2003, vol.103, no.437 2003, vol.103, no.46
2003, vol.103, no.497 2003, vol.103, no.558

题名作者出版年年卷期
Front-end process technology for sub-50nm CMOS and beyondYoshitaka Tsunashima20032003, vol.103, no.159
Junction leakage characteristics of shallow trench isolation (STI) with nitrogen pile-up sidewall oxideMyeong Won Lee; In Man Kang; Byung Yong Choi; Dong-Soo Woo; Woo Young Choi; Jong Duk Lee; Byung-Gook Park20032003, vol.103, no.159
Shallow junction formed by UV pulsed laser annealing for Si micro-electronicsTakashi Noguchi20032003, vol.103, no.159
Fabrication of low loss transmission line with surface micromachining technologyHan-Shin Lee; Sung-Chan Kim; Byoung-Ok Lim; Kyoung-Man Kim; Won-Young Uhm; Young-Hoon Chun; Dong-Hoon Shin; Soon-Koo Kim; Hyun-Chang Park; Jin-Koo Rhee20032003, vol.103, no.159
Structural analyses of Cu[111] layer on Nb[110] barrier formed on SiO{sub}2Md. Maniruzzaman; Mayumi B. Takeyama; Yuichiro Hayasaka; Eiji Aoyagi; Tetu Ohsuna; Atsushi Noya20032003, vol.103, no.159
High performance poly-silicon TFT by excimer laser annealingMin Koo Han20032003, vol.103, no.159
Effects of self-aligned field induced drain with double spacer on the characteristics of poly-Si TFTJeong-Ah Ahn; Ohyun Kim20032003, vol.103, no.159
Properties of LiNbO{sub}3 thin films fabricated CSD (chemical solution decomposition) methodYong-Seong Kim; Soon-Won Jung; Sang-Hyun Jeong; Yong-Il In; Kwang-Ho Kim; Kwangsoo No20032003, vol.103, no.159
Local characterization of electronic transport in microcrystalline germanium thin films by atomic force microscopy using a conducting probeK. Makihara; Y. Okamoto; H. Nakagawa; M. Ikeda; H. Murakami; S. Miyazaki20032003, vol.103, no.159
Double-gate MOSFETs for nano CMOS technology - body-tied double-gate MOSFETsJong-Ho Lee; Tai-Su Park; Euijoon Yoon20032003, vol.103, no.159
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