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期刊


ISSN1475-7435
刊名International Journal of Nanotechnology
参考译名国际纳米技术杂志
收藏年代2004～2023



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023

2010, vol.7, no.1 2010, vol.7, no.2/3 2010, vol.7, no.4/8 2010, vol.7, no.9/12

题名作者出版年年卷期
Nanoelectronics with CMOS transistors: electrostatic and quantum effectsXavier Jehl; Marc Sanquer; J. Gautier; M. Vinet20102010, vol.7, no.4/8
Germanium on insulator and new 3D architectures opportunities for integrationM. Vinet; C. Le Royer; P. Batude; J.-F. Damlencourt; J.-M. Hartmann; L. Hutin; K. Romanjek; A. Pouydebasque; O. Thomas20102010, vol.7, no.4/8
Oxides heterostructures for nanoelectronicsC. Dubourdieu; I. Gelard; O. Salicio; G. Saint-Girons; B. Vilquin; G. Hollinger20102010, vol.7, no.4/8
Simulation, modelling and characterisation of quasi-ballistic transport in nanometer sized field effect transistors: from TCAD to atomistic simulationStephan Roche; Thierry Poiroux; Gilles Lecarval; Sylvain Barraud; Francois Triozon; Martin Person; Yann Michel Niquet20102010, vol.7, no.4/8
Molecular electronics and reconfigurable logicI. O'Connor; J. Liu; D. Navarro; R. Daviot; N. Abouchi; P. E. Gaillardon; F. Clermidy20102010, vol.7, no.4/8
Electronic properties of epitaxial grapheneClaire Berger; Jean-Yves Veuillen; Laurence Magaud; Pierre Mallet; Valerio Olevano; M. Orlita; P. Plochocka; C. Faugeras; G. Martinez; Marek Potemski; Cecile Naud; Laurent P. Levy; Didier Mayou20102010, vol.7, no.4/8
Quantum coherence and magnetic scatteringChristopher Bauerle; Pascal Degiovanni; Laurent Saminadayar20102010, vol.7, no.4/8
Disorder in low dimensions: localisation effects in spin glass wires and cold atomsD. Carpentier; E. Orignac; G. Paulin; T. Roscilde20102010, vol.7, no.4/8
New trends for the Kondo effect in nanostructuresSabine Andergassen; Denis Feinberg; Serge Florens; Mireille Lavagna; Shiueyuan Shiau; Pascal Simon; Raphael Van Roermund20102010, vol.7, no.4/8
Hybrid superconducting nanostructures: very low temperature local probing and noiseC. Chapelier; F. Lefloch; H. Courtois; K. Hasselbach20102010, vol.7, no.4/8
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