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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A biased random instruction generation environment for architectural verification of pipelined processorsTa-Chung Chang; Vikram Iyengar; Elizabeth M. Rudnick20002000, vol.16, no.1-2
A buffer-oriented methodology for microarchitecture validationNoppanunt Utamaphethai; R. D. (Shawn) Blanton; John Paul Shen20002000, vol.16, no.1-2
An efficient logic equivalence checker for industrial circuitsJaehong Park; Carl Pixley; Michael Burns; Hyunwoo Cho;20002000, vol.16, no.1-2
An RTL abstraction technique for processor microarchitecture validation and test generationJian Shen; Jacob A. Abraham20002000, vol.16, no.1-2
Automatic vector generation using constraints and biasingJun Yuan; Kurt Shultz; Carl Pixley; Hillel Miller; Adnan Aziz20002000, vol.16, no.1-2
Formal value-range and variable testability techniques for high-level design-for-testabilitySandhya Seshadri; Michael S. Hsiao20002000, vol.16, no.1-2
On efficiently producing quality tests for custom circuits in PowerPC microprocessorsLi-C. Wang; Magdy S. Abadir20002000, vol.16, no.1-2
Oscillation ring delay test for high performance microprocessorsWen Ching Wu; Chung Len Lee; Ming Shae Wu; Jwu E. Chen; Magdy S. Abadir20002000, vol.16, no.1-2
Testing for function and performance: towards an integrated processor validation methodologyPradip Bose20002000, vol.16, no.1-2
Verification simulation acceleration using code-perturbationByeong Min; Gwan Choi20002000, vol.16, no.1-2



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