先进制造业知识服务平台
国家科技图书文献中心机械分馆　　工信部产业技术基础公共服务平台　　国家中小企业公共服务示范平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing DefectsXIANGDONG XUAN; ABHIJIT CHATTERJEE; ADIT D. SINGH20062006, vol.22, no.4-6
Embedded System Level Self-Test for Mixed-Signal IO VerificationV. LOUKUSA20062006, vol.22, no.4-6
Built-In-Self-Testing Techniques for Programmable Capacitor ArraysAMIT LAKNAUR; SAI RAGHURAM DURBHA; HAIBO WANG20062006, vol.22, no.4-6
A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog TestingM. A. DOMINGUEZ; J. L. AUSIN; J. F. DUQUE-CARRILLO20062006, vol.22, no.4-6
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault SimulationMICHEL MORNEAU; ABDELHAKIM KHOUAS20062006, vol.22, no.4-6
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case StudyYUKIYA MIURA20062006, vol.22, no.4-6
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated CircuitsAMIR ZJAJO; JOSE PINEDA DE GYVEZ; GUIDO GRONTHOUD20062006, vol.22, no.4-6
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay LinesJIUN-LANG HUANG20062006, vol.22, no.4-6
Towards Fault-Tolerant RF Front EndsTEJASVI DAS; ANAND GOPALAN; CLYDE WASHBURN; P. R. MUKUND20062006, vol.22, no.4-6
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter TestingK. GEORGOPOULOS; A. LECHNER; M. BURBIDGE; A. RICHARDSON20062006, vol.22, no.4-6
1234



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024