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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志:理论与应用
收藏年代2000~2023



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2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Design of Approximate Subtractors and Dividers for Error Tolerant Image Processing ApplicationsGorantla, Anusha; Deepa, P.20192019, vol.35, no.6
EditorialAgrawal, Vishwani D.20192019, vol.35, no.6
An Efficient Technique to Detect Stealthy Hardware Trojans Independent of the Trigger SizeSebt, S. M.; Patooghy, A.; Beitollahi, H.20192019, vol.35, no.6
Comparing Graph-Based Algorithms to Generate Test Cases from Finite State MachinesMariano, Matheus Monteiro; de Souza, Erica Ferreira; Endo, Andre Takeshi; Vijaykumar, Nandamudi Lankalapalli20192019, vol.35, no.6
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal AcquisitionMoon, Thomas; Choi, Hyun Woo; Keezer, David C.; Chatterjee, Abhijit20192019, vol.35, no.6
Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to NBTI and HCI Using Neural NetworksYang, Chuang; Feng, Feng20192019, vol.35, no.6
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D StackSun, Yi; Zhang, Fanchen; Jiang, Hui; Nepal, Kundan; Dworak, Jennifer; Manikas, Theodore; Bahar, R. Iris20192019, vol.35, no.6
Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality MetricsSavaria, Yvon; Thibeault, Claude; Hasib, Omar Al-Terkawi20192019, vol.35, no.6
Noise and Spur Comparison of Delta-Sigma Modulators in Fractional-N PLLsZhou, Bo; Li, Yao; Zhao, Fuyuan20192019, vol.35, no.6
Leveraging Balanced Logic Gates as Strong PUFs for Securing IoT Against Malicious AttacksYu, Weize; Wen, Yiming20192019, vol.35, no.6
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