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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Identification of Random/Clustered TSV Defects in 3D IC During Pre-Bond TestingMaity, Dilip Kumar; Roy, Surajit Kumar; Giri, Chandan20192019, vol.35, no.5
Equivalence Checking and Compaction of n-input Majority Terms Using Implicants of MajorityDevadoss, Rajeswari; Paul, Kolin; Balakrishnan, M.20192019, vol.35, no.5
Novel Randomized Placement for FPGA Based Robust ROPUF with Improved UniquenessChauhan, Arjun Singh; Sahula, Vineet; Mandal, Atanendu Sekhar20192019, vol.35, no.5
Classical Cryptanalysis Attacks on Logic Locking TechniquesMazumdar, Bodhisatwa; Saha, Soma; Bairwa, Ghanshyam; Mandal, Souvik; Nikhil, Tatavarthy Venkat20192019, vol.35, no.5
A State Machine Encoding Methodology Against Power Analysis AttacksAgrawal, Richa; Vemuri, Ranga; Borowczak, Mike20192019, vol.35, no.5
RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor TestingSuryasarman, Vasudevan Madampu; Biswas, Santosh; Sahu, Aryabartta20192019, vol.35, no.5
Special Issue on International Conference on VLSI Design and Embedded SystemsBasu, Kanad; Chen, Mingsong; Parekhji, Rubin20192019, vol.35, no.5
SAT-based Silicon Debug of Electrical Errors under Restricted Observability EnhancementKumar, Binod; Fujita, Masahiro; Singh, Virendra20192019, vol.35, no.5
EditorialAgrawal, Vishwani D.20192019, vol.35, no.5
Novel Randomized Placement for FPGA Based Robust ROPUF with Improved Uniqueness (vol 63, pg 1025, 2019)Sahula, Vineet; Mandal, Atanendu Sekhar; Chauhan, Arjun Singh20192019, vol.35, no.5
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