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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Test Development Through Defect and Test Escape Level Estimation for Data ConvertersCARSTEN WEGENER; MICHAEL PETER KENNEDY20062006, vol.22, no.4-6
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave FittingLUIS ROLINDEZ; SALVADOR MIR; AHCENE BOUNCEUR; LUIS ROLINDEZ; JEAN-LOUIS CARBONERO20062006, vol.22, no.4-6
Next Generation ADC Massive Parallel Testing with Real Time Parameter EvaluationHEINZ MATTES; STEPHANE KIRMSER; SEBASTIAN SATTLER20062006, vol.22, no.4-6
A First Step for an INL Spectral-Based BIST: The Memory OptimizationV. KERZERHO; S. BERNARD; V. KERZERHO; P. CAUVET; J. M. JANIK20062006, vol.22, no.4-6
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter TestingK. GEORGOPOULOS; A. LECHNER; M. BURBIDGE; A. RICHARDSON20062006, vol.22, no.4-6
Towards Fault-Tolerant RF Front EndsTEJASVI DAS; ANAND GOPALAN; CLYDE WASHBURN; P. R. MUKUND20062006, vol.22, no.4-6
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay LinesJIUN-LANG HUANG20062006, vol.22, no.4-6
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated CircuitsAMIR ZJAJO; JOSE PINEDA DE GYVEZ; GUIDO GRONTHOUD20062006, vol.22, no.4-6
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case StudyYUKIYA MIURA20062006, vol.22, no.4-6
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault SimulationMICHEL MORNEAU; ABDELHAKIM KHOUAS20062006, vol.22, no.4-6
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