先进制造业知识服务平台
国家科技图书文献中心机械分馆　　工信部产业技术基础公共服务平台　　国家中小企业公共服务示范平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2024, vol.40, no.1 2024, vol.40, no.2 2024, vol.40, no.3 2024, vol.40, no.4 2024, vol.40, no.5 2024, vol.40, no.6

题名作者出版年年卷期
An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization AlgorithmZheng, Leiqing; Arasteh, Bahman; Mehrabani, Mahsa Nazeri; Abania, Amir VahideZheng, Leiqing; Arasteh, Bahman; Mehrabani, Mahsa Nazeri; Abania, Amir Vahide20242024, vol.40, no.4
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning ModelsDhar, Manali; Mukherjee, Chiradeep; Banerjee, Ananya; Manna, Debasmita; Panda, Saradindu; Maji, BansibadanDhar, Manali; Mukherjee, Chiradeep; Banerjee, Ananya; Manna, Debasmita; Panda, Saradindu; Maji, Bansibadan20242024, vol.40, no.4
ADC Dynamic Parameter Testing Scheme Under Relaxed ConditionsYuan, Jun; Zhang, Yuyang; Zhang, Liangrui; Hou, Shuaiqi; Han, YukunYuan, Jun; Zhang, Yuyang; Zhang, Liangrui; Hou, Shuaiqi; Han, Yukun20242024, vol.40, no.4
Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and ImplementationKhairullah, Shawkat SabahKhairullah, Shawkat Sabah20242024, vol.40, no.4
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20242024, vol.40, no.4
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBMLi, Gen; Li, Wenhai; Wen, Tianzhu; Sun, Weichao; Tang, XiLi, Gen; Li, Wenhai; Wen, Tianzhu; Sun, Weichao; Tang, Xi20242024, vol.40, no.4
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset CorrectionAhilan, A.; Gorantla, Anusha; Kiruba, Gladys; Hamad, Asmaa A.; Hassan, Mohamed M.; Venkatram, N.; Sindhu, T. V.Ahilan, A.; Gorantla, Anusha; Kiruba, Gladys; Hamad, Asmaa A.; Hassan, Mohamed M.; Venkatram, N.; Sindhu, T. V.20242024, vol.40, no.4
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoTMouleeswaran, S. K.; Ramesh, K.; Manikandan, K.; Anbalagan, VivekyoganandMouleeswaran, S. K.; Ramesh, K.; Manikandan, K.; Anbalagan, Vivekyoganand20242024, vol.40, no.4
Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-ElementsIwata, Hiroshi; Yamasaki, Kokoro; Yamaguchi, Ken'ichiIwata, Hiroshi; Yamasaki, Kokoro; Yamaguchi, Ken'ichi20242024, vol.40, no.4
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security SolutionPanchore, Meena; Rajan, Chithraja; Singh, JawarPanchore, Meena; Rajan, Chithraja; Singh, Jawar20242024, vol.40, no.4
12



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2025