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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



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2024 2025

2024, vol.40, no.1 2024, vol.40, no.2 2024, vol.40, no.3 2024, vol.40, no.4 2024, vol.40, no.5 2024, vol.40, no.6

题名作者出版年年卷期
Efficient Selective Image Fusion: A PCB Diagnosis Approach and ImplementationWu, Xueqin; Chen, Yikai; Wang, Zekai; Tian, Chenming; Shen, ZhonghuaWu, Xueqin; Chen, Yikai; Wang, Zekai; Tian, Chenming; Shen, Zhonghua20242024, vol.40, no.5
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20242024, vol.40, no.5
Investigating and Improving the Performance of Radiation-Hardened SRAM Cell with the Use of Multi-Voltage TransistorsAhirwar, Rachana; Pattanaik, Manisha; Srivastava, PankajAhirwar, Rachana; Pattanaik, Manisha; Srivastava, Pankaj20242024, vol.40, no.5
Generating Synthetic Layout Test Patterns using Deep LearningMahmoud, Adel; El-Kharashi, M. Watheq; Salama, CherifMahmoud, Adel; El-Kharashi, M. Watheq; Salama, Cherif20242024, vol.40, no.5
2023 JETTA-TTTC Best Paper Award: Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, and Theodore Manikas, “Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift,” Journal of Electronic Testing: Theory and Applications, Volume 39, Number 2, pp. 227–243, April 2023 20242024, vol.40, no.5
PCB Defect Recognition by Image Analysis using Deep Convolutional Neural NetworkZhang, Jiantao; Shi, Xinyu; Qu, Dong; Xu, Haida; Chang, ZhengfangZhang, Jiantao; Shi, Xinyu; Qu, Dong; Xu, Haida; Chang, Zhengfang20242024, vol.40, no.5
Test Modules for Enhanced Testability of Single Flux Quantum Integrated CircuitsQoutb, Abdelrahman G.; Kawa, Jamil; Friedman, Eby G.Qoutb, Abdelrahman G.; Kawa, Jamil; Friedman, Eby G.20242024, vol.40, no.5
Reliability Analysis for a GaAs LNA with Temperature StressLin, Qian; Wang, Mei-qianLin, Qian; Wang, Mei-qian20242024, vol.40, no.5
Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMPFeng, Yibo; Sun, Lu; Lu, Jiarun; Li, Zhenxiao; Tian, Jin; Qiu, YangFeng, Yibo; Sun, Lu; Lu, Jiarun; Li, Zhenxiao; Tian, Jin; Qiu, Yang20242024, vol.40, no.5
YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit BoardsYunpeng, Gao; Rui, Zhang; Mingxu, Yang; Sabah, FahadYunpeng, Gao; Rui, Zhang; Mingxu, Yang; Sabah, Fahad20242024, vol.40, no.5



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