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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2005, vol.26, no.1 2005, vol.26, no.10 2005, vol.26, no.11 2005, vol.26, no.12 2005, vol.26, no.2 2005, vol.26, no.3
2005, vol.26, no.4 2005, vol.26, no.5 2005, vol.26, no.6 2005, vol.26, no.7 2005, vol.26, no.8 2005, vol.26, no.9
2005, vol.26, no.9 2

题名作者出版年年卷期
Monolithic AlAs-InGaAs-InGaP-GaAs HRT-FETS With PVCR of 960 at 300 KChing-Sung Lee; Wei-Chou Hsu; Jim-Chin Huang; Yeong-Jia Chen; Hsin-Hung Chen20052005, vol.26, no.2
2 V-Operated InGaP-AlGaAs-InGaAs Enhancement-Mode Pseudomorphic HEMTL. H. Chu; E. Y. Chang; S. H. Chen; Y. C. Lien; C. Y. Chang20052005, vol.26, no.2
High-Power RF Switching Using Ill-Nitride Metal-Oxide-Semiconductor Heterojunction CapacitorsG. Simin; A. Koudymov; Z.-J. Yang; V. Adivarahan; J. Yang; M. Asif Khan20052005, vol.26, no.2
High-Temperature Thermal Stability Performance inδ-Doped In{sub}0.425Al{sub}0.575As-In{sub}0.65Ga{sub}0.35 As Metamorphic HEMTWei-Chou Hsu; Yeong-Jia Chen; Ching-Sung Lee; Tzong-Bin Wang; Yu-Shyan Lin; Chang-Luen Wu20052005, vol.26, no.2
A New Pd-InP Schottky Hydrogen Sensor Fabricated by Electrophoretic Deposition With Pd NanoparticlesYen-I Chou; Chia-Ming Chen; Wen-Chau Liu; Huey-Ing Chen20052005, vol.26, no.2
Extending Storage Dielectric Scaling Limit by Reoxidizing Nitrided NO Dielectric for Trench DRAMYung-Hsien Wu; Eugine Hsieh; Robert Kuo; Sierra Lai; Alex Ku20052005, vol.26, no.2
Memory Performance and Retention of an All-Organic Ferroelectric-Like Memory TransistorRaoul Schroeder; Leszek A. Majewski; Monika Voigt; Martin Grell20052005, vol.26, no.2
Electrical Characterization of SOI Substrates Incorporating WSi{sub}x Ground PlanesM. Bain; M. Jin; S. H. Loh; P. Baine; B. M. Armstrong; H. S. Gamble; D. W. McNeill20052005, vol.26, no.2
Thermally Robust TaTb{sub}xN Metal Gate Electrode for n-MOSFETs ApplicationsC. Ren; H. Y. Yu; X. P. Wang; H. H. H. Ma; Daniel S. H. Chan; M.-F. Li; Yee-Chia Yeo; C. H. Tung; N. Balasubramanian; A. C. H. Huan; J. S. Pan; D.-L. Kwong20052005, vol.26, no.2
Temperature Variation Mapping of a Microelectromechanical System by Thermoreflectance ImagingStephane Grauby; Stefan Dilhaire; Sebastien Jorez; Wilfrid Claeys20052005, vol.26, no.2
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