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期刊
ISSN
2043-0647
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——亚太版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2014
2014, no.Suppl.
2014, no.Suppl.1
题名
作者
出版年
年卷期
The evolution of fountain pen nanolithography: Controlled multi-probe delivery of liquids and gases
Talia Yeshua; Shalom Weinberger; Hesham Taha; Aaron Lewis; Michael Layani; Shlomo Magdassi; Christian Lehmann; Stephanie Reich; Chaim Sukenik; Sophia Kokotov; Rimma Dekhter
2014
2014, no.Suppl.1
AGILENT: NEW technique combines SECM and AFM to enhance research capabilities
Julian P. Heath
2014
2014, no.Suppl.1
ASYLUM RESEARCH an Oxford Instruments Company: Scanning Microwave Impedance Microscopy (sMIM) for High Resolution Electrical Characterization
Julian P. Heath
2014
2014, no.Suppl.1
BRUKER NANO SURFACES Performing sub-molecular imaging of the DNA double helix with PeakForce Tapping
Julian P. Heath
2014
2014, no.Suppl.1
PARK SYSTEMS: Innovative 3D AFM Technology for High Resolution Sidewall Imaging
Julian P. Heath
2014
2014, no.Suppl.1
WITec: Nearfield-Raman - Imaging beyond the diffraction limit
Julian P. Heath
2014
2014, no.Suppl.1
Photothermal excitation for improved cantilever drive performance in tapping mode atomic force microscopy
Aleksander Labuda; Jason Cleveland; Nicholas A. Geisse; Marta Kocun; Ben Ohler; Roger Proksch; Mario B. Viani; Deron Walters
2014
2014, no.Suppl.1
Investigating cell mechanics with atomic force microscopy
Andrea Slade; Bede Pittenger; Pascale Milani; Arezki Boudaoud; Olivier Hamant; Petra Kioschis; Leslie M. Ponce; Mathias Hafner
2014
2014, no.Suppl.1
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