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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2004, vol.25, no.1 2004, vol.25, no.10 2004, vol.25, no.11 2004, vol.25, no.12 2004, vol.25, no.2 2004, vol.25, no.3
2004, vol.25, no.4 2004, vol.25, no.5 2004, vol.25, no.6 2004, vol.25, no.7 2004, vol.25, no.8 2004, vol.25, no.9

题名作者出版年年卷期
LOW-K BCB Passivation on AlGaN-GaN HEMT FabricationWen-Kai Wang; Ching-Huao Lin; Po-Chen Lin; Cheng-Kuo Lin; Fan-Hsiu Huang; Yi-Jen Chan; Guan-Ting Chen; Jen-Inn Chyi20042004, vol.25, no.12
Two-Stage Broadband High-Gain W-Band Amplifier Using 0.1-μm Metamorphic HEMT TechnologyBok-Hyung Lee; Dan An; Mun-Kyo Lee; Byeong-Ok Lim; Sam-Dong Kim; Jin-Koo Rhee20042004, vol.25, no.12
Extraction of the Average Collector Velocity in High-Speed "Type-II" InP-GaAsSb-InP DHBTsH. G. Liu; N. Tao; S. P. Watkins; C. R. Bolognesi20042004, vol.25, no.12
GaAs MOSFET Using InAlP Native Oxide as Gate DielectricX. Li; Y. Cao; D. C. Hall; P. Fay; B. Han; A. Wibowo; N. Pan20042004, vol.25, no.12
CVD Rhenium and PVD Tantalum Gate MOSFETs Fabricated With a Replacement TechniqueJames Pan; Don Canaperi; Rajarao Jammy; Michelle Steen; John Pellerin; Ming-Ren Lin20042004, vol.25, no.12
Characterization of Novel Varistor+Inductor Integrated Passive DevicesRamesh Raghavendra; Pat Bellew; Neil Mcloughlin; Goran Stojanovic; Mirjana Damnjanovic; Vladan Desnica; Ljiljana Zivanov20042004, vol.25, no.12
Low-Frequency Noise Measurement-Based Reliability Testing of VLSI Interconnects with Different GeometryK. S. Rawat; G. H. Massiha20042004, vol.25, no.12
HfO{sub}2 MIS Capacitor with Copper Gate ElectrodeTsu-Hsiu Perng; Chao-Hsin Chien; Ching-Wei Chen; Ming-Jui Yang; Peer Lehnen; Chun-Yen Chang; Tiao-Yuan Huang20042004, vol.25, no.12
Integrated Tunable Magnetic RF InductorMarina Vroubel; Yan Zhuang; Behzad Rejaei; Joachim N. Burghartz20042004, vol.25, no.12
800 V 4H-SiC RESURF-Type Lateral JFETsKazuhiro Fujikawa; Kaoru Shibata; Takeyoshi Masuda; Shinichi Shikata; Hideki Hayashi20042004, vol.25, no.12
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