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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
On a statistical fault diagnosis approach enabling fast yield ramp-upCamelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg20032003, vol.19, no.4
Modeling the random parameters effects in a non-split model of gate oxide shortM. Renovell; J. M. Galliere; F. Azais; Y. Bertrand20032003, vol.19, no.4
Simulating realistic bridging and crosstalk faults in an industrial settingJonathan Bradford; Hartmut Delong; Ilia Polian; Bernd Becker20032003, vol.19, no.4
Synchronous full-scan for asynchronous handshake circuitsFrank Te Beest; Ad Peeters; Kees Van Berkel; Hans Kerkhoff20032003, vol.19, no.4
Data invalidation analysis for scan-based debug on multiple-clock system chipsSandeep Kumar Goel; Bart Vermeulen20032003, vol.19, no.4
Multi-TAP controller architecture for digital system chipsBart Vermeulen; Tom Waayers; Sjaak Bakker20032003, vol.19, no.4
A test time reduction algorithm for test architecture design for core-based system chipsSandeep Kumar Goel; Erik Jan Marinissen20032003, vol.19, no.4
Efficient transition fault ATPG algorithms based on stuck-at test vectorsXiao Liu; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran20032003, vol.19, no.4
On selecting testable paths in scan designsYun Shao; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara20032003, vol.19, no.4
Reducing average and peak test power through scan chain modificationOzgur Sinanoglu; Ismet Bayraktaroglu; Alex Orailoglu20032003, vol.19, no.4
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