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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
Defect-tolerant Logic with Nanoscale Crossbar CircuitsTAD HOGG; GREG SNIDER; M. Tehranipoor20072007, vol.23, no.2-3
A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic NanotechnologyJASON G. BROWN; R. D. BLANTON; M. Tehranipoor20072007, vol.23, no.2-3
Built-in Self-test and Defect Tolerance in Molecular Electronics-based NanofabricsZHANGLEI WANG; KRISHNENDU CHAKRABARTY; M. Tehranipoor20072007, vol.23, no.2-3
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wireJING HUANG; MARIAM MOMENZADEH; FABRIZIO LOMBARDI; M. Tehranipoor20072007, vol.23, no.2-3
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing SystemsJIA DI; PARAG K. LALA; M. Tehranipoor20072007, vol.23, no.2-3
QCA Circuits for Robust Coplanar CrossingSANJUKTA BHANJA; MARCO OTTAVI; FABRIZIO LOMBARDI; SALVATORE PONTARELLI; M. Tehranipoor20072007, vol.23, no.2-3
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular AutomataMO LIU; CRAIG S. LENT; M. Tehranipoor20072007, vol.23, no.2-3
Testing and Diagnosis of Realistic Defects in Digital Microfluidic BiochipsFEI SU; WILLIAM HWANG; ARINDAM MUKHERJEE; KRISHNENDU CHAKRABARTY; M. Tehranipoor20072007, vol.23, no.2-3
Towards Nanoelectronics Processor ArchitecturesWENJING RAO; ALEX ORAILOGLU; RAMESH KARRI; M. Tehranipoor20072007, vol.23, no.2-3
Designing Nanoscale Logic Circuits Based on Markov Random FieldsK. NEPAL; R. I. BAHAR; J. MUNDY; W. R. PATTERSON; A. ZASLAVSKY; M. Tehranipoor20072007, vol.23, no.2-3



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