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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current SensorRoman Mozuelos; Yolanda Lechuga; Mar Martinez; Salvador Bracho20112011, vol.27, no.2
Construction and Analysis of Augmented Time CompactorsEmil Gizdarski20112011, vol.27, no.2
Balanced Secure Scan: Partial Scan Approach for Secret Information ProtectionMichiko Inoue; Tomokazu Yoneda; Muneo Hasegawa; Hideo Fujiwara20112011, vol.27, no.2
Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMsGiuseppe Di Guglielmo; Luigi Di Guglielmo; Franco Fummi; Graziano Pravadelli20112011, vol.27, no.2
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital ConvertersLe Jin20112011, vol.27, no.2
An Asynchronous Design for Testability and Implementation in Thin-film Transistor TechnologyChi-Hsuan Cheng; James Chien-Mo Li20112011, vol.27, no.2
Fault Tolerant Single Error Correction EncodersJuan Antonio Maestro; Pedro Reviriego; Costas Argyrides; Dhiraj K. Pradhan20112011, vol.27, no.2
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision ProblemsDesta Tadesse; R. Iris Bahar; Joel Grodstein20112011, vol.27, no.2
Analysis of Resistive Open Defects in Drowsy SRAM CellsAfshin Nourivand; Asim J. Al-Khalili; Yvon Savaria20112011, vol.27, no.2



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