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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2023
全部
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2012, vol.28, no.1
2012, vol.28, no.2
2012, vol.28, no.3
2012, vol.28, no.4
2012, vol.28, no.5
2012, vol.28, no.6
题名
作者
出版年
年卷期
Built-in Self Test of RF Subsystems with Integrated Detectors
Chaoming Zhang; Ranjit Gharpurey; Jacob A. Abraham
2012
2012, vol.28, no.5
Experimental Results of Testing a BIST E-A ADC on the HOY Wireless Test Platform
Shao-Feng Hung; Hao-Chiao Hong
2012
2012, vol.28, no.5
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement
Hyun Jin Kim; Jacob A. Abraham
2012
2012, vol.28, no.5
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial Sensors
Elie H. Sarraf; Ankit Kansal; Mrigank Sharma; Edmond Cretu
2012
2012, vol.28, no.5
On Chip Signal Generators for Low Overhead ADC BIST
Jingbo Duan; Bharath Vasan; Chen Zhao; Degang Chen; Randall Geiger
2012
2012, vol.28, no.5
High Speed On-Chip Signal Generation for Debug and Diagnosis
Tsung-Yen Tsai; Sadok Aouini; Gordon Walter Roberts
2012
2012, vol.28, no.5
Low-Distortion Sinewave Generation Method Using Arbitrary Waveform Generator
Kazuyuki Wakabayashi; Keisuke Kato; Takafumi Yamada; Osamu Kobayashi; Haruo Kobayashi; Fumitaka Abe; Kiichi Niitsu
2012
2012, vol.28, no.5
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement Capability
Kemal Kulovic; Martin Margala
2012
2012, vol.28, no.5
Novel Practical Built-in Current Sensors
Samed Maltabas; Kemal Kulovic; Martin Margala
2012
2012, vol.28, no.5
On the Use of Static Temperature Measurements as Process Variation Observable
Didac Gomez; Josep Altet; Diego Mateo
2012
2012, vol.28, no.5
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