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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2023
全部
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2013, vol.29, no.1
2013, vol.29, no.2
2013, vol.29, no.3
2013, vol.29, no.4
2013, vol.29, no.5
2013, vol.29, no.6
题名
作者
出版年
年卷期
On the Simulation of HCI-Induced Variations of IC Timings at High Level
Olivier Heron; Clement Bertolini; Chiara Sandionigi; Nicolas Ventroux; Francois Marc
2013
2013, vol.29, no.2
CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
Liang Chen; Mojtaba Ebrahimi; Mehdi B. Tahoori
2013
2013, vol.29, no.2
Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems
Cristiana Bolchini; Matteo Carminati; Antonio Miele
2013
2013, vol.29, no.2
Reliability-Aware Heterogeneous 3D Chip Multiprocessor Design
Ismail Akturk; Ozcan Ozturk
2013
2013, vol.29, no.2
Circuit Level Concurrent Error Detection in FSMs
Natalja Kehl; Wolfgang Rosenstiel
2013
2013, vol.29, no.2
Secure JTAG Implementation Using Schnorr Protocol
Amitabh Das; Jean Da Rolt; Santosh Ghosh; Stefaan Seys; Sophie Dupuis; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Ingrid Verbauwhede
2013
2013, vol.29, no.2
Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems
S. Bergaoui; A. Wecxsteen; R. Leveugle
2013
2013, vol.29, no.2
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
Edgar Leonardo Romero; Marius Strum; Wang Jiang Chau
2013
2013, vol.29, no.2
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks
A. Kavithamani; V. Manikandan; N. Devarajan
2013
2013, vol.29, no.2
Novel Self-Timed, Pipelined Clock Scan Architecture
Kanad Chakraborty; James E. Kelly; Brian P. Evans
2013
2013, vol.29, no.2
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