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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
An On-Chip Sensor to Monitor NBTI Effects in SRAMsA. Ceratti; T. Copetti; L. Bolzani; F. Vargas; R. Fagundes20142014, vol.30, no.2
An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail DistributionsWorawit Somha; Hiroyuki Yamauchi20142014, vol.30, no.2
Error Correction Schemes with Erasure Information for Fast MemoriesSamuel Evain; Valentin Savin; Valentin Gherman20142014, vol.30, no.2
Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent FeaturesBahman Arasteh; Seyed Ghassem Miremadi; Amir Masoud Rahmani20142014, vol.30, no.2
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent UndersamplingDebesh Bhatta; Aritra Banerjee; Sabyasachi Deyati; Nicholas Tzou; Abhijit Chatterjee20142014, vol.30, no.2
A Test Time Theorem and its ApplicationsPraveen Venkataramani; Suraj Sindia; Vishwani D. Agrawal20142014, vol.30, no.2
Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length CodingHaiying Yuan; Jiaping Mei; Hongying Song; Kun Guo20142014, vol.30, no.2
Soft Fault Diagnosis of Analog Circuits via Frequency Response Function MeasurementsYongle Xie; Xifeng Li; Sanshan Xie; Xuan Xie; Qizhong Zhou20142014, vol.30, no.2



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