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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
Analyzing Vulnerability of Asynchronous Pipeline to Soft Errors: Leveraging Formal VerificationLodhi, Faiq Khalid; Hasan, Syed Rafay; Hasan, Osman; Awwad, Falah20162016, vol.32, no.5
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay TestingShintani, Michihiro; Uezono, Takumi; Hatayama, Kazumi; Masu, Kazuya; Sato, Takashi20162016, vol.32, no.5
A Comprehensive FPGA-Based Assessment on Fault-Resistant AES against Correlation Power Analysis AttackDofe, Jaya; Pahlevanzadeh, Hoda; Yu, Qiaoyan20162016, vol.32, no.5
CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern GeneratorYeh, Kuen-Wei; Huang, Jiun-Lang; Wang, Laung-Terng20162016, vol.32, no.5
Test Data Compression for System-on-chip using Flexible Runs-aware PRL CodingYuan, Haiying; Ju, Zijian; Sun, Xun; Guo, Kun; Wang, Xiuyu20162016, vol.32, no.5
A Novel Compact Model for On-Chip Vertically-Coiled Spiral InductorsLiu, Tong; Liu, Jun; Chen, Junli; Yu, Faxin; Wang, Wenbo; Hou, Bing20162016, vol.32, no.5
UntitledAgrawal, Vishwani D.20162016, vol.32, no.5
Optimization of Test Wrapper for TSV Based 3D SOCsRahaman, Hafizur; Roy, Surajit Kumar; Giri, Chandan20162016, vol.32, no.5
A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSOZhang, Chaolong; He, Yigang; Yuan, Lifen; He, Wei; Xiang, Sheng; Li, Zhigang20162016, vol.32, no.5
Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUTKumar, T. Nandha; Almurib, Haider A. F.; Lombardi, Fabrizio20162016, vol.32, no.5
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