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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC CircuitsTadeusiewicz, Michal; Halgas, Stanislaw20172017, vol.33, no.2
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency ScalingSheshadri, Vijay; Agrawal, Vishwani D.; Agrawal, Prathima20172017, vol.33, no.2
Link Testing: a Survey of Current Trends in Network on ChipAghaei, Babak; Khademzadeh, Ahmad; Reshadi, Midia; Badie, Kambiz20172017, vol.33, no.2
A Parallel Test Application Method towards Power ReductionGuo, Yang; Li, Zhentao; Deng, Ding20172017, vol.33, no.2
EditorialAgrawal, Vishwani D.20172017, vol.33, no.2
A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip NetworksBhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh20172017, vol.33, no.2
Reliability Model for Multiple-Error Protected Static MemoriesJahanirad, Hadi20172017, vol.33, no.2
A Bridged Contactless Measurement Technique for LC Tank Based Voltage-Controlled OscillatorLiu, Zhe; Yu, Xiao-Peng; Fan, Teng-long; Cao, Cheng; Sui, Wen-Quan20172017, vol.33, no.2
Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and PassivationMo, Jiongjiong; Chen, Hua; Yu, Faxin; Wang, Liping20172017, vol.33, no.2
VI-Based Measurement System Focusing on Space ApplicationsSeixas, L. E., Jr.; Finco, S.; Gimenez, S. P.20172017, vol.33, no.2



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