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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2010

题名作者出版年年卷期
Development of a Cold Field-Emission Gun for a 200kV Atomic Resolution Electron MicroscopeYuji Kohno; Eiji Okunishi; Takeshi Tomita; Isamu Ishikawa; Toshikatsu Kaneyama; Yoshihiro Ohkura; Yukihito Kondo; Thomas Isabell20102010
Nanoscale Chemical Compositional Analysis with an Innovative S/TEM-EDX SystemPeter Schlossmacher; Dmitri O. Klenov; Bert Freitag20102010
Helium Ion Beam Processing for Nano-fabrication and Beam-Induced ChemistryPaul Alkemade; Vadim Sidorkin; Ping Chen; Emile van der Drift; Anja van Langen; Diederik Maas; Emile van Veldhoven; Larry Scipioni20102010
Mesostructure and Adsorption Isotherm of Hybrid Organosilica Molecular SieveEduardo R. Magdaluyo, Jr.; Raymond V. Rivera Virtudazo; Emily V. Castriciones20102010
SEM-EDX Analysis of Intermetallic Phases in a Cu-Zn-Sn Shape Memory AlloyRichard D. V. Espiritu; Alberto V. Amorsoh, Jr.20102010
Zinc Oxide Nanostructures in the Zinc Electrode of a Zinc-Carbon Dry CellSyed Nasimul Alam; Madhukar Poloju20102010
Confocal Laser Scanning Microscopy of Electrical Conductors at Fire ScenesNicholas Carey; Niamh Nic Daeid20102010
Infrared Microspectroscopy in Cancer Diagnosis. Do We Need Synchrotron Light?Josep Sule-Suso; Gianfelice Cinque20102010
SEM-EDX of Morphology of Electroless Nickel Coatings with Tin and TungstenWei Sha; Nurzairyani H. J. Mohd Zalrin; Xiaomin Wu20102010
Off-Axis Electron Holography for Field Mapping in the Semiconductor IndustryDavid Cooper; Armand Beche; Martien Den Hertog; Aurelian Masseboeuf; Jean-Luc Rouviere; Pascale Bayle Guille-maud; Nartisco Gambacorti20102010
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