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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2014 2014, no.Suppl.

题名作者出版年年卷期
Investigating cell mechanics with atomic force microscopyAndrea Slade; Bede Pittenger; Pascale Milani; Arezki Boudaoud; Olivier Hamant; Petra Kioschis; Leslie M. Ponce; Mathias Hafner20142014, no.Suppl.
Photothermal excitation for improved cantilever drive performance in tapping mode atomic force microscopyAleksander Labuda; Jason Cleveland; Nicholas A. Geisse; Marta Kocun; Ben Ohler; Roger Proksch; Mario B. Viani; Deron Walters20142014, no.Suppl.
WITec: Nearfield-Raman - Imaging beyond the diffraction limitJulian P. Health20142014, no.Suppl.
PARK SYSTEMS: Innovative 3D AFM Technology for High Resolution Sidewall ImagingJulian P. Health20142014, no.Suppl.
BRUKER NANO SURFACES: Performing sub-molecular imaging of the DNA double helix with PeakForce TappingJulian P. Health20142014, no.Suppl.
ASYLUM RESEARCH an Oxford Instruments Company Scanning Microwave Impedance Microscopy (sMIM) for High Resolution Electrical CharacterizationJulian P. Health20142014, no.Suppl.
AGILENT: NEW technique combines SECM and AFM to enhance research capabilitiesJulian P. Health20142014, no.Suppl.
The evolution of fountain pen nanolithography: Controlled multi-probe delivery of liquids and gasesTalia Yeshua; Shalom Weinberger; Hesham Taha; Aaron Lewis; Michael Layani; Shlomo Magdassi; Christian Lehmann; Stephanie Reich; Chaim Sukenik; Sophia Kokotov; Rimma Dekhter20142014, no.Suppl.
Agilent TechnologiesJulian P. Heath20142014, no.Suppl.
Evactron By XEI Scientific: Evactron Decontaminators lead the way in remote plasma cleaning of electron microscopes for contamination free images and dataJulian P. Heath20142014, no.Suppl.
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