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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2014 2014, no.Suppl.

题名作者出版年年卷期
Study of helium ion beam-exposed nanostructures by AFM in a SEMNils Anspach; Frank Hitzel; Endre Majorovits; Fabian Perez-Willard20142014
Capturing the killer cellsRebecca Pool20142014
STM detects rotation in moleculesJulian P. Heath20142014
Confocal microscopy captures cancer clonesJulian P. Heath20142014
Confocal microscopy reveals embryogenesis secretsJulian P. Heath20142014
Researchers drive ultrafast electron microscopy forwardJulian P. Heath20142014
Why seedlings grow towards lightJulian P. Heath20142014
Light and electron microscopy of microstructure and fractography of an ultrahigh-strength martensitic steelXianbo Shi; Wei Wang; Wei Ye; Wei Sha; Yiyin Shan; Minggang Shen; Ke Yang20142014
Use of automated image acquisition and stitching in scanning electron microscopy: Imaging of large scale areas of materials at high resolutionJim Buckman20142014
Scientific CMOS camera technology: A breeding ground for new microscopy techniquesGerhard Hoist20142014
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