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期刊


ISSN2043-0639
刊名Microscopy and Analysis
参考译名显微镜学与分析——美洲版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2015

题名作者出版年年卷期
Recent observations of structure, in situ defect formation, and synthesis of 2D materials using atomic - resolution TEMZonghoon Lee20152015
Fuel cells and ceramics - characterizing real-world samples with a FE-SEM ready for challengesL. Maniguet; F. Roussel; R. Martin; E. Djurado; M. C. Steil; E. Bichaud; A. Le Goff; M. Holzinger; S. Cosnier; J. M. Chaix; C. Carry20152015
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?A. De Backer; A. De Wael; J. Gonnissen; G. T. Martinez; A. Beche; K. E. MacArthur; L. Jones; P. D. Nellist; S. Van Aert20152015
The architect with a microscopeChris Parmenter20152015
Fluorescent dye survives super-resolution imagingChris Parmenter20152015
Extreme electron tomographyChris Parmenter20152015
Small World winners revealedChris Parmenter20152015
High praise for PortlandChris Parmenter20152015
Transmission electron microscopy study of interface driven resistive switching in epitaxial NiO nanocrystalsXuan Cheng; Jivika Sullaphen; Matthew Weyland; Hongwei Liu; Nagarajan Valanoor20152015
New insights in silver alloy corrosion delivered by digital light microscopy reveal information otherwise undetectable by SEMOlivier Schalm; Patrick Storme20152015
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