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期刊


ISSN2043-0655
刊名Microscopy and Analysis
参考译名显微镜学与分析——欧洲版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2010 2010, vol.2010 SUPPL..

题名作者出版年年卷期
Carl Zeiss NTSJulian P. Heath20102010, vol.2010 SUPPL..
TescanJulian P. Heath20102010, vol.2010 SUPPL..
SkyScanJulian P. Heath20102010, vol.2010 SUPPL..
Olympus Soft Imaging SolutionsJulian P. Heath20102010, vol.2010 SUPPL..
Olympus Microscopy: Microscopy for every application and every userJulian P. Heath20102010, vol.2010 SUPPL..
FEIJulian P. Heath20102010, vol.2010 SUPPL..
Electron Microscopy SciencesJulian P. Heath20102010, vol.2010 SUPPL..
2009 under the Microscope: Advanced Imaging and Superresolution LM SystemsJulian P. Heath20102010, vol.2010 SUPPL..
Development of a Cold Field-Emission Gun for a 200kV Atomic Resolution Electron MicroscopeYuji Kohno; Eiji Okunishi; Takeshi Tomita; Isamu Ishikawa; Toshikatsu Kaneyama; Yoshihiro Ohkura; Yukihito Kondo; Thomas Isabell20102010
Nanoscale Chemical Compositional Analysis with an Innovative S/TEM-EDX SystemPeter Schlossmacher; Dmitri O. Klenov; Bert Freitag; Sebastian von Harrach; Andy Steinbach20102010
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