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期刊


ISSN2043-0655
刊名Microscopy and Analysis
参考译名显微镜学与分析——欧洲版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2008, no.111 2008, no.112 2008, no.113 2008, no.114 2008, no.115 2008, no.116

题名作者出版年年卷期
Application of Optimum HRTEM Noise Filters in Mineralogy and Related SciencesToshihiro Kogure; Paul H. C. Eilers; Kazuo Ishizuka20082008, no.116
Automatic Crystal Orientation and Phase Mapping in TEM by Precession DiffractionE. F. Rauch; M. Veron; J. Portillo; D. Bultreys; Y. Maniette; S. Nicolopoulos20082008, no.116
The Design of Microscopes: Principles, Aesthetics and ErgonomicsBruce Hutchison20082008, no.116
A Cryo-Transmission Electron Microscopy Study of Asymmetric PMMA CopolymersChristopher Parmenter; Svetla Stoilova-McPhie; Stefan Bon20082008, no.116
Morphology, Physicochemistry and Phase Analysis of Neuburg Siliceous EarthJurgen Goske; Werner Kachler20082008, no.115
Optical Projection Tomography for In-Vivo Imaging of Drosophila melanogasterHeiko Meyer; Alex Darrell; Athanasios Metaxakis; Charalambos Savakis; Jorge Ripoll20082008, no.115
Characterization of the Microstructural Aspects of Machinable α-β Phase BrassG. Pantazopoulos; A. Vazdirvanidis20082008, no.115
Noise and Colocalization in Fluorescence Microscopy: Solving a ProblemJeremy Adler; Fredrik Bergholm; Stamatis N. Pagakis; Ingela Parmryd20082008, no.115
Fractography of Brittle Materials: Analysis of Fractures in Ceramics and GlassesGeorge D. Quinn20082008, no.114
Scanning Transmission Electron Microscopy: A Tool for Biology and Materials ScienceVlad Stolojan20082008, no.114
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