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期刊


ISSN2043-0655
刊名Microscopy and Analysis
参考译名显微镜学与分析——欧洲版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2011

题名作者出版年年卷期
Atomic Resolution Secondary Electron Imaging in Aberration Corrected STEMHiromi Inada; Mitsuru Konno; Keiji Tamura; Yuya Suzuki; Kuniyasu Nakamura; Yimei Zhu20112011
Low Beam-Energy Energy-Dispersive X-Ray Spectroscopy for NanotechnologyPatrick Camus20112011
Development of a High Throughput Electron Microscope for Nanoscale AnalysisMitsuhide Matsushita; Shuji Kawai; Takeshi Iwama; Katsuhiro Tanaka; Toshiko Kuba; Noriaki Endo; Thomas C. Isabell20112011
Bonding and TSV in 3D IC Integration: Physical Analysis with a Plasma FIBMaaike M. V. Taklo; Armin Klumpp; Peter Ramm; Laurens Kwakman; German Franz20112011
Variable Pressure Scanning Electron Microscopy of Vicia faba Stigmatic PapillaeWen Chen; Fred Stoddard; Timothy C. Baldwin20112011
Fracture Surface, Impact Energy and Hardness of Ni-Free High-Mn SteelsWei Sha; H. H. Haji Talib; Eric A. Wilson; Raj Rajendran; Savko Malinov; Harvey R. Charlesworth; Lee Ibbitson20112011
Widefield Fluorescence Microscopy of Centrosome Separation in DT40 CellsHelfrid Hochegger20112011
Nanoparticle Tracking Analysis of Cell Exosome and Nanovesicle SecretionSimon J. Powis; Chin Y. Soo; Ying Zheng; Elaine C. Campbell; Andrew Riches20112011
Sono-Electrochemical Synthesis and SEM/TEM Analysis of Ultrafine Copper PowdersArchana Mallik20112011
Review of Plasma Cleaning Technology for Decontamination in FIB, SEM and TEMTom Levesque20112011
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