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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：电子装置
收藏年代2000～2022

关联期刊参考译名收藏年代
電子情報通信学会技術研究報告电子信息通信学会技术研究报告：电子装置 


全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022

2000, vol.100, no.1 2000, vol.100, no.147 2000, vol.100, no.148 2000, vol.100, no.149 2000, vol.100, no.2 2000, vol.100, no.235
2000, vol.100, no.236 2000, vol.100, no.265 2000, vol.100, no.266 2000, vol.100, no.305 2000, vol.100, no.306 2000, vol.100, no.318
2000, vol.100, no.370 2000, vol.100, no.405 2000, vol.100, no.406 2000, vol.100, no.505 2000, vol.100, no.506 2000, vol.100, no.547
2000, vol.100, no.548 2000, vol.100, no.549 2000, vol.100, no.57 2000, vol.100, no.58 2000, vol.100, no.641 2000, vol.100, no.642
2000, vol.100, no.683

题名作者出版年年卷期
SMC of a-Si in an electric field and its application to TFTsJin Jang; Soo Young Yoon; Seong Jin Park; Kyung Ho Kim; Kyu Sik Cho20002000, vol.100, no.149
Reliability of low temperature poly-silicon thin film transistors under dynamic stressY. Uraoka; T. Hatayama; T. Fuyuki; T. Kawamura; Y. Tsuchihashi20002000, vol.100, no.149
High performance CMOS technology by using low temperature poly-Si TFTs on a glass substrateMichiko Takei; Tatsuya Uematsu; Kenich Yoshino; Fumiyo Takeuchi; Yasuyoshi Mishima; Nobuo Sasaki20002000, vol.100, no.149
Crystal growth of low-temperature processed poly-Si by excimer laser annealing - dependences of poly-Si grain on energy density and shot numberNaoto Matsuo; Naoya Kawamoto; Ryouhei Taguchi; Hisashi Abe; Tomoyuki Nouda; Hiroki Hamada20002000, vol.100, no.149
MOS memory using Si nanocrystals formed by wet etching of poly-silicon along grain boundariesSeong-Jong Yoo; Jongho Lee; Hyungcheol Shin20002000, vol.100, no.149
A 4 kV SiC epitaxial PN junction diode with a low on-resistanceK. Fujihira; S. Tamura; T. Kimoto; H. Matsunami20002000, vol.100, no.149
Excimer laser doping for ZnO pn diode fabricationToru Aoki; David C. Look; Yoshinori Hatanaka20002000, vol.100, no.149
1/f noise in Schottky barrier structureJ. I. Lee; I. K. Hanl; H. J. Kiml; D. M. Kim; J. Brini; A. Chovet; C. A. Dimitriadis20002000, vol.100, no.149
Characterization of semiconductor structures in the VUV wavelength range using spectroscopic ellipsometry and spectroscopic photometryPierre Boher; Jean Philippe Piel; Patrick Evrard; Christophe Defranoux; Jean Louis Stehle20002000, vol.100, no.149
Deep sub-μm scale photoluminescence image of wide bandgap materials by cryogenic scanning microscopeMasahiro Yoshimoto; Junji Saraie20002000, vol.100, no.149
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