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期刊

ISSN	0734-2101
刊名	Journal of Vacuum Science & Technology
参考译名	真空科学与技术，A辑：真空、表面与膜
收藏年代	2000～2013

全部

2000	2001	2002	2003	2004	2005
2006	2007	2008	2009	2010	2011
2012	2013

2001, vol.19, no.1	2001, vol.19, no.2	2001, vol.19, no.3	2001, vol.19, no.4, P. I	2001, vol.19, no.4, P. II	2001, vol.19, no.5
2001, vol.19, no.6

题名

作者

出版年

年卷期

Photovoltaic characteristics of BR/p-silicon heterostructures using surface photovoltage spectroscopy

Lin Song Li; Tao Xu; Yan Jie Zhang; Jian Jin; Tie jin Li; Bingsuo Zou; Jian-Ping Wang

2001

2001, vol.19, no.4, P. I

Observation of the bone matrix structure of intact and regenerative zones of tibias by atomic force microscopy

Vitor Baranauskas; I. Garavello-Freitas; Z. Jingguo; M. A. Cruz-Hofling

2001

2001, vol.19, no.4, P. I

Structural and electrical of chemical vapor deposited W/n-Si{sub}0.83 Ge{sub}0.17/Si(001) and chemical vapor deposited WSi{sub}x/n-Si{sub}0.83Ge{sub}0.17/Si90010

Y. C. Jang D. O. Shin; K. S. Kim; K. -H. Shim; N. -E. Lee; S. P. Youn; K. J. Roh; Y. H Roh

2001

2001, vol.19, no.4, P. I

Fabrication of smooth diamond films on SiO{sub}2 by the addition of nitrogen to the gas feed in hot-filament chemical vapor deposition

Vitor Baranauskas; Alfredo C. Peterlevitz; Zhao Jingguo; Steven F. Durrant

2001

2001, vol.19, no.4, P. I

Micro-crystalline diamond and nano-carbon structures produced using a high argon concentration in hot-filament chemical vapor deposition

Vitor Baranauskas; Alfredo C. Peterlevitz; Helder J. Ceragioli; Steven F. Durrant

2001

2001, vol.19, no.4, P. I

Damage in etching of (Br, Sr) TiO{sub}3 thin films using inductively coupled plasma

Sung-Ki Choi; Dong-Pyo Kim; Chang-Il Kim; Eui-Goo Chang

2001

2001, vol.19, no.4, P. I

Etch characteristics of CeO{sub}2 thin films as a buffer layer for the application of ferroelectric random access memory

Chang Seok Oh; Chang Il Kim

2001

2001, vol.19, no.4, P. I

Chemical interaction and adhesion characteristics at the interface of metals (Cu,Ta0 and low-k) cyclohexane-based plasma polymer (CHexPP) films

K. J. Kim; K. S. Kim; N. -E. Lee; J. Choi; D. Jung

2001

2001, vol.19, no.4, P. I

Low temperature deposition and characterization of polycrystalline Si films on polymer substrates

K. Xu; S. I. Shah; D. Guerin

2001

2001, vol.19, no.4, P. I

Cross-sectional transmission electron microscopy investigation of the dead layer of ZnS:Ag, Al phosphors in field emission displays

K. Kajiwara

2001

2001, vol.19, no.4, P. I